In this section:
The Metrics Explorer provides an interface for understanding the code metrics data collected by DTP. Click on the Metrics Summary widget or the Metrics - Top 10 Tree Map widget to access the Metrics Explorer (see Metrics Widgets). You can also access the Metrics Explorer by clicking on a tile in the Single Metric Overview Report report or by clicking on a value in the Module column in the table of the report. The Metrics Explorer is divided into four panels:
- Search panel; see Using the Search Panel.
- Search results table; see Viewing Search Results.
- Metrics details panel; see Viewing Metrics Details.
- Source panel; see Viewing Source Code.
Using the Search Panel
The Metrics Explorer shows data according to the filter, target build, and metric specified in the widget or report you clicked to open the explorer, but you can easily change the search to view specific metric information.
Click Change Search to open the Search Options overlay.
You can set the following search parameters:
- Filter: Choose a filter from the Filter drop-down menu (see Creating and Managing Filters for additional information).
- Target build: Choose a build from the Target Build drop-down menu that contains the metric data you want to see. By default, metrics data is only stored for the last eight builds (see About Metrics Storage for additional information).
- Specify the metric level: Click File, Type, or Method to specify at which level metrics are counted. You will need to add new metrics to the search if you change the metric level because previously selected metrics will be removed.
- Select metrics: You can display up to three metrics in the explorer at a time. Click a Select a metric link and choose a metric from the drop-down menu. The metric level you specify determines which metrics are available in the drop-down menu.
- Change metrics threshold: Click and drag the slider endpoints for a metric to set upper and lower boundaries. Values for metrics outside the boundaries will be excluded from search results table.
- Search for specific file paths: Enter a string in the File Path Search bar to search for file paths that contain the string.
- Filter metrics search results by module: Select specific modules to include in your search.
- Click Search when your search parameters are set to load the results in the search results panel.
Viewing Search Results
The search results table shows values for specified metrics according to your search parameters. The columns rendered in the table depend on the metrics level you selected in the Search Options. For example, if you choose the file level, then only the File column will display along with any metrics you selected. The Namespace column displays in every search.
You can perform the following actions:
- Click on a column header to sort by ascending or descending order
- Click and drag the metrics slider to set upper and lower thresholds; values outside the boundaries will still be displayed, but the values inside the boundaries will be highlighted.
- Click on a row to view additional information in the details panel (see Viewing Metrics Details). Source code is displayed in the source panel (see Viewing Source Code).
Viewing Metrics Details
The metrics details panel includes a table labeled General, which shows metrics data associated with the row selected in the search results panel. When file- or type-level metrics are selected in the Search Options, a second table labeled Aggregated appears in the details panel. The Aggregated table includes aggregation values (Average, Minimum, Maximum, and Sum) for metrics data associated with the selected row.
You can click on any column header in the available tables to sort by ascending or descending order.
Viewing Source Code
Clicking on a row in the search results panel opens the source file in the source panel. If the method level is selected, the source code panel shows the specific line in the source code where the method exists. You must have permissions to view source code in Report Center explorer views (see User Administration Overview for additional information).